Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Autor: Diego Mateo, Marvin Onabajo, Eduardo Aldrete-Vidrio, Jose Silva-Martinez, M. Amine Salhi, Stefan Dilhaire, Stéphane Grauby, Josep Altet
Přispěvatelé: Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Electronic Engineering Department, Universitat Politècnica de Catalunya [Barcelona] (UPC), Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Analog and Mixed Signal Center (AMSC), Texas A&M University [College Station], project TEC2008-01856
Jazyk: angličtina
Rok vydání: 2010
Předmět:
Heterodyne
Materials science
low-noise amplifier
Integrated circuits
02 engineering and technology
Integrated circuit
Hardware_PERFORMANCEANDRELIABILITY
CMOS differential temperature sensors
Temperature measurement
law.invention
RF analog circuits
law
Electrònica
0202 electrical engineering
electronic engineering
information engineering

Hardware_INTEGRATEDCIRCUITS
Center frequency
Instrumentation
Engineering (miscellaneous)
heterodyne method
business.industry
homodyne method
Applied Mathematics
RF built-in test
020208 electrical & electronic engineering
Low noise amplifiers
Electrical engineering
Enginyeria electrònica [Àrees temàtiques de la UPC]
Low-noise amplifier
020202 computer hardware & architecture
Michelson interferometer
Interferometry
Direct-conversion receiver
CMOS
analog circuits characterization
Circuits integrats
business
integrated circuits
Zdroj: Recercat. Dipósit de la Recerca de Catalunya
instname
Measurement Science and Technology
Measurement Science and Technology, IOP Publishing, 2010, 21 (7), pp.075104 (10). ⟨10.1088/0957-0233/21/7/075104⟩
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
ISSN: 0957-0233
1361-6501
Popis: International audience; This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively.
Databáze: OpenAIRE