On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study
| Autor: | A.D. Spyronasios, Haralampos-G. Stratigopoulos, Louay Abdallah, Salvador Mir |
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| Přispěvatelé: | Department of Electrical & Computer Engineering [Thessaloniki], Aristotle University of Thessaloniki, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Předmět: |
Engineering
Noise measurement business.industry Noise (signal processing) Monte Carlo method 02 engineering and technology Commit Automatic test pattern generation 020202 computer hardware & architecture Test (assessment) Integrated Circuits Monte-Carlo-method Measurement theory PACS 85.42 0202 electrical engineering electronic engineering information engineering Electronic engineering 020201 artificial intelligence & image processing [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Algorithm Envelope detector |
| Zdroj: | Proc. of IEEE Asian Test Symposium (ATS'11) IEEE Asian Test Symposium (ATS'11) IEEE Asian Test Symposium (ATS'11), Nov 2011, New Delhi, India. pp.365-370, ⟨10.1109/ATS.2011.44⟩ Asian Test Symposium |
| Popis: | ISBN 978-1-4577-1984-4; International audience; In this paper we present the theory for evaluating the test error that we commit when we replace a standard analog test by a lower-cost alternative measurement. The evaluation takes place during the design and test development phases and relies on a tractable number of simulations. The test error is expressed in terms of test escape and yield loss which are estimated in parts per million accuracy. The theory is demonstrated with an example. In particular, we evaluate whether a dedicated on-chip envelope detector can be used to eliminate the NF test for an LNA. |
| Databáze: | OpenAIRE |
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