Instrumental conditions of secondary ion mass spectrometry that affect sensitivity for observation of very high masses

Autor:	William. Aberth
Rok vydání:	1986
Předmět:	Chemistry Analytical chemistry Cesium Mass spectrometry Acceleration voltage Mass Spectrometry Spectral line Analytical Chemistry Ion Molecular Weight Secondary ion mass spectrometry Mass spectrum Sensitivity (control systems) Low Mass
Zdroj:	Analytical Chemistry. 58:1221-1225
ISSN:	1520-6882 0003-2700
DOI:	10.1021/ac00297a055
Popis:	It is demonstrated by comparing the mass spectra of cesium iodide cluster ions obtained under different operating parameters that such factors as acceleration voltage, system pressure, and primary beam energy affect the high-mass signal current to a greater extent than that of the low mass. The measurements imply that consideration should be given to these parameters for more effective analysis of high-mass compounds. 30 references, 7 figures.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6429510082fde20ee66604ca270bc7c https://doi.org/10.1021/ac00297a055 Zobrazit plný text záznamu