Soft x-ray free-electron laser induced damage to inorganic scintillators
Autor: | Joachim Schulz, Marion Harmand, Stefan Moeller, Shafagh Dastjani Farahani, J. Wild, Kai Tiedtke, L. Vysin, Karel Saskl, R.A. Loch, Sven Toleikis, Věra Hájková, Saša Bajt, Ryszard Sobierajski, Harald Sinn, Tomáš Burian, Germano Galasso, Jacek Krzywinski, Marek Jurek, Nicola Coppola, Jaromír Chalupský, Libor Juha, Pavel Boháček, Henry N. Chapman, Thomas Tschentscher, Pavol Sovák, C. Ozkan, Mitsuru Nagasono, Jérôme Gaudin, Martin Přeček |
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Přispěvatelé: | Institute of Physics [Prague], Czech Academy of Sciences [Prague] (CAS), Faculty of Mathematics and Physics [Praha/Prague], Charles University [Prague] (CU), Paul Scherrer Institute (PSI), European XFEL GmbH (XFEL), European XFEL GmbH, Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron [Hamburg] (DESY), Centre d'Etudes Lasers Intenses et Applications (CELIA), Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Bordeaux (UB), Photone Sciences, Deutsches Elektronen-Synchrotron (DESY), Department of Physics [Hamburg], Universität Hamburg (UHH), Dutch Institute for Fundamental Energy Research [Eindhoven] (DIFFER), Institute of Physics, Polish Academy of Sciences, Polska Akademia Nauk = Polish Academy of Sciences (PAN), SLAC National Accelerator Laboratory (SLAC), Stanford University, Institut de minéralogie, de physique des matériaux et de cosmochimie (IMPMC), Muséum national d'Histoire naturelle (MNHN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de recherche pour le développement [IRD] : UR206-Centre National de la Recherche Scientifique (CNRS), Institut für Mechanik und Mechatronik, Technische Universität Wien, RIKEN - Institute of Physical and Chemical Research [Japon] (RIKEN), nstitute of Materials Research, Slovak Academy of Science, Institute of Physics, P. J. Šafárik University, Université de Bordeaux (UB)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS) |
Jazyk: | angličtina |
Rok vydání: | 2015 |
Předmět: |
Materials science
Analytical chemistry chemistry.chemical_element Synchrotron radiation 02 engineering and technology Radiation 01 natural sciences Fluence Pulsed laser deposition law.invention 010309 optics Optics law 0103 physical sciences Irradiation Radiation resistance [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] business.industry Yttrium 021001 nanoscience & nanotechnology Laser Electronic Optical and Magnetic Materials chemistry ddc:620 0210 nano-technology business |
Zdroj: | Optical Materials Express Optical Materials Express, OSA pub, 2015, 5 (2), pp.254-264. ⟨10.1364/OME.5.000254⟩ Optical Materials Express 5(2), 254-264 (2015). doi:10.1364/OME.5.000254 Optical Materials Express, 2015, 5 (2), pp.254-264. ⟨10.1364/OME.5.000254⟩ |
ISSN: | 2159-3930 |
DOI: | 10.1364/OME.5.000254⟩ |
Popis: | International audience; An irreversible response of inorganic scintillators to intense soft x-ray laser radiation was investigated at the FLASH (Free-electron LASer in Hamburg) facility. Three ionic crystals, namely, Ce:YAG (cerium-doped yttrium aluminum garnet), PbWO4 (lead tungstate), and ZnO (zinc oxide), were exposed to single 4.6 nm ultra-short laser pulses of variable pulse energy (up to 12 μJ) under normal incidence conditions with tight focus. Damaged areas produced with various levels of pulse fluences, were analyzed on the surface of irradiated samples using differential interference contrast (DIC) and atomic force microscopy (AFM). The effective beam area of 22.2 ± 2.2 μm2 was determined by means of the ablation imprints method with the use of poly(methyl methacrylate) - PMMA. Applied to the three inorganic materials, this procedure gave almost the same values of an effective area. The single-shot damage threshold fluence was determined for each of these inorganic materials. The Ce:YAG sample seems to be the most radiation resistant under the given irradiation conditions, its damage threshold was determined to be as high as 660.8 ± 71.2 mJ/cm2. Contrary to that, the PbWO4 sample exhibited the lowest radiation resistance with a threshold fluence of 62.6 ± 11.9 mJ/cm2. The threshold for ZnO was found to be 167.8 ± 30.8 mJ/cm2. Both interaction and material characteristics responsible for the damage threshold difference are discussed in the article. |
Databáze: | OpenAIRE |
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