Distance dependence of force and dissipation in non-contact atomic force microscopy on Cu(100) and Al(111)

Autor: Alexis Baratoff, Roland Bennewitz, Laurent Nony, Ernst Meyer, Oliver Pfeiffer
Přispěvatelé: Institute of Physics (NCCR), University of Basel (Unibas), Laboratoire matériaux et microélectronique de Provence (L2MP), Université Paul Cézanne - Aix-Marseille 3-Université de Provence - Aix-Marseille 1-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institute of Physics [Basel]
Rok vydání: 2004
Předmět:
Zdroj: Nanotechnology
Nanotechnology, Institute of Physics, 2004, 15, pp.S101-S107. ⟨10.1088/0957-4484/15/2/021⟩
Nanotechnology, 2004, 15, pp.S101-S107. ⟨10.1088/0957-4484/15/2/021⟩
ISSN: 1361-6528
0957-4484
DOI: 10.1088/0957-4484/15/2/021
Popis: The dynamic characteristics of a tip oscillating in the nc-AFM mode in close vicinity to a Cu(100)-surface are investigated by means of phase variation experiments in the constant amplitude mode. The change of the quality factor upon approaching the surface deduced from both frequency shift and excitation versus phase curves yield to consistent values. The optimum phase is found to be independent of distance. The dependence of the quality factor on distance is related to 'true' damping, because artefacts related to phase misadjustment can be excluded. The experimental results, as well as on-resonance measurements at different bias voltages on an Al(111) surface, are compared to Joule dissipation and to a model of dissipation in which long-range forces lead to viscoelastic deformations.
Databáze: OpenAIRE