Composition Related Electrical Active Defect States of InGaAs and GaAsN

Autor: Ladislav Harmatha, B. Sciana, Wojciech Dawidowski, Lubica Stuchlikova, Jaroslav Kováč, A. Kosa, Marek Tłaczała
Rok vydání: 2017
Předmět:
Zdroj: Advances in Electrical and Electronic Engineering, Vol 15, Iss 1, Pp 114-119 (2017)
ISSN: 1804-3119
1336-1376
DOI: 10.15598/aeee.v15i1.2023
Popis: This paper discusses results of electrically active defect states - deep energy level analysis in InGaAs and GaAsN undoped semiconductor structures grown for solar cell applications. Main attention is focused on composition and growth condition dependent impurities and the investigation of their possible origins. For this purpose a widely utilized spectroscopy method, Deep Level Transient Fourier Spectroscopy, was utilized. The most significant responses of each sample labelled as InG2, InG3 and NG1, NG2 were discussed in detail and confirmed by simulations and literature data. The presence of a possible dual conduction type and dual state defect complex, dependent on the In/N composition, is reported. Beneficial characteristics of specific indium and nitrogen concentrations capable of eliminating or reducing certain point defects and dislocations are stated.
Databáze: OpenAIRE