Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors

Autor: Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin Houshmand Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar
Rok vydání: 2022
Předmět:
Zdroj: 2022 IEEE International Reliability Physics Symposium (IRPS).
DOI: 10.1109/irps48227.2022.9764424
Popis: ispartof: 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) ispartof: IEEE International Reliability Physics Symposium (IRPS) location:TX, Dallas date:27 Mar - 31 Mar 2022 status: published
Databáze: OpenAIRE