Autor: |
Rattanaporn Norarat, Mari Napari, S. Singkarat, Harry J. Whitlow, Mikko Laitinen, Orapin Chienthavorn, Timo Sajavaara, Nitipon Puttaraksa |
Rok vydání: |
2011 |
Předmět: |
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Zdroj: |
Advanced Materials Research. 254:132-135 |
ISSN: |
1662-8985 |
DOI: |
10.4028/www.scientific.net/amr.254.132 |
Popis: |
The lithographic exposure characteristic of amorphous silica (SiO2) was investigated for 6.8 MeV16O3+ions. A programmable proximity aperture lithography (PPAL) technique was used for the ion beam exposure. After exposure, the exposed pattern was developed by selective etching in 4% v/v HF. Here, we report on the development of SiO2in term of the etch depth dependence on the ion fluence. This showed an exponential approach towards a constant asymptotic etch depth with increasing ion fluence. An example of microfluidic channels produced by this technique is demonstrated. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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