The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes
| Autor: | Werner J. Blau, Evelyn M. Doherty, Jonathan N. Coleman, Jerome Joimel, Sukanta De, Aleksey Shmeliov, John J. Boland, Peter N. Nirmalraj, Vittorio Scardaci, Philip E. Lyons |
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| Jazyk: | angličtina |
| Rok vydání: | 2009 |
| Předmět: |
Materials science
business.industry Physics General Chemistry Conductive atomic force microscopy Conductivity Optical conductivity Electric arc Optics Transmittance General Materials Science Composite material Thin film business Electrical conductor GeneralLiterature_REFERENCE(e.g. dictionaries encyclopedias glossaries) Sheet resistance |
| DOI: | 10.1016/j.carbon.2009.04.040 |
| Popis: | PUBLISHED We have prepared thin films of arc discharge single walled nanotubes by vacuum filtration. For film thicknesses greater than 40 nm, the films are of high optical quality; the optical transmission varies by 40 nm. Conductive atomic force microscopy maps show reasonably uniform current flow out of the plane of the film. For all thicknesses, the optical transmittance scales with film thickness as expected for a thin conducting film with optical conductivity of 1.7 ? 104 S/m (? = 550 nm). For films with t > 40 nm the ratio of DC to optical conductivity was ?DC/?Op = 13.0, leading to values of transmittance and sheet resistance such as T = 80% and Rs = 110 ?/? for the t = 40 nm film. Electromechanically, these films were very stable showing conductivity changes of Science Foundation Ireland funded collaboration (SFI grant 03/CE3/M406s1) between Trinity College Dublin, University College Cork and Hewlett Packard, Dublin Inkjet Manufacturing Operation |
| Databáze: | OpenAIRE |
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