Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping

Autor:	David Stifter, Michael Pircher, Christoph K. Hitzenberger, Gabi Grützner, Gisela Ahrens, Karin Wiesauer, Reinhold Oster, Rainer Engelke
Rok vydání:	2008
Předmět:	Materials science Birefringence genetic structures medicine.diagnostic_test business.industry Strain mapping Coherence length Interferometry Polarization sensitive Optics Ultrahigh resolution Optical coherence tomography Transversal (combinatorics) medicine sense organs business
Zdroj:	Fracture of Nano and Engineering Materials and Structures ISBN: 9781402049712 Scopus-Elsevier
DOI:	10.1007/1-4020-4972-2_287
Popis:	Optical coherence tomography (OCT), originally developed and so far nearly exclusively used for biomedical applications (e.g., [1,2]), is a contact-free, non-destructive technique based on low-coherence interferometry to image structures within translucent and turbid materials. Commonly, cross-sectional reflectivity images with a depth-resolution determined by the coherence length of the near-infrared light source are obtained. When OCT is performed in a polarization sensitive way (PS-OCT), additional information about birefringence within a material is obtained by mapping the retardation between ordinary and extraordinary rays [3]. Because birefringence is induced when strain occurs, PS-OCT provides depth resolved information about the internal stress within a sample.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b3eafb7cfd458edaaa4c2c56555b398a https://doi.org/10.1007/1-4020-4972-2_287 Zobrazit plný text záznamu