CdS Roughness by Anti-Stokes Raman Spectroscopy

Autor:	Sergio Calixto, J. Rafael Molina-Contreras, Claudio Frausto-Reyes, Cirilo Medina-Gutierrrez
Rok vydání:	2006
Předmět:	symbols.namesake Materials science Analytical chemistry symbols Surface finish Raman spectroscopy
Zdroj:	ECS Transactions. 3:399-406
ISSN:	1938-6737 1938-5862
DOI:	10.1149/1.2357230
Popis:	A Raman system, with the 514.5 and 632.8 nm excitations wavelengths, was used to qualitatively detect the surface roughness of a CdS wafer sample. Anti-Stokes Raman spectra were obtained from several sample zones with different mean roughness levels, previously measured with Atomic Force Microscopy. Our results show that there is a spectrum profile which can be related to the sample roughness, which shows a better definition with the 514.5 nm excitation wavelength.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b242798d4dcea2d16a996d02934b237e https://doi.org/10.1149/1.2357230 Zobrazit plný text záznamu