Quantified insights into LED variability
Autor: | T. Merelle, Robin Bornoff, Josephine Sari, Gabor Farkas, Alessandro Di Bucchianico |
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Přispěvatelé: | Stochastic Operations Research, Statistics |
Jazyk: | angličtina |
Rok vydání: | 2018 |
Předmět: |
Manufacturing process
020209 energy Thermal resistance Structure function LED Variation 02 engineering and technology Root cause law.invention Thermal conductivity law Thermal 0202 electrical engineering electronic engineering information engineering Structure Function Environmental science Biological system Light-emitting diode |
Zdroj: | THERMINIC 2018-24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings |
DOI: | 10.1109/THERMINIC.2018.8593315 |
Popis: | There is a variation in the characteristics of an LED partly due to variation in the manufacturing process and the sourcing of materials from differing vendors. From a thermal perspective these variations result in differing thermal characteristics such as R thJC (the thermal resistance between chip junction and case) and Z th (the thermal impedance curve). This study seeks to quantify the measured variation of a number of LED part samples and provide insight into the root cause of those variations. Such information would provide additional confidence to a lighting engineer when selecting LEDs, when modelling their thermal behaviour and thus modelling their thermally dependent optical performance. |
Databáze: | OpenAIRE |
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