Surface roughness of oxidised copper films studied by atomic force microscopy and spectroscopic light scattering
| Autor: | Carl-Gustaf Ribbing, T. Lindström, Daniel Rönnow, J. Isidorsson |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Length scale
Thermal oxidation Condensed matter physics Chemistry Scattering Metals and Alloys Analytical chemistry Surfaces and Interfaces Surface finish Fractal dimension Light scattering Surfaces Coatings and Films Electronic Optical and Magnetic Materials Materials Chemistry Surface roughness Thin film |
| Zdroj: | Scopus-Elsevier |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/s0040-6090(98)00503-3 |
| Popis: | The interface roughness of Cu2O films produced by thermal oxidation of Cu was studied by spectroscopic elastic light scattering and atomic force microscopy. No correlation could be found between the roughness of the two interfaces, although the amplitude and the length scale of the roughness changed in the same way with film thickness for both interfaces. Both interfaces were found to have a fractal dimension of two. A first order perturbation theory was used to analyse the light scattering data; theory and experiment are in good agreement within the limits of the theory. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect