Computing aberration coefficients for plane-symmetric reflective systems: A Lie algebraic approach

Autor:	Antonio Barion, Martijn Anthonissen, Jan ten Thije Boonkkamp, wilbert ijzerman
Přispěvatelé:	Computational Illumination Optics
Jazyk:	angličtina
Rok vydání:	2023
Předmět:	FOS: Physical sciences Computer Vision and Pattern Recognition Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Physics - Optics Optics (physics.optics)
Zdroj:	Journal of the Optical Society of America A, Optics, Image Science and Vision, 40(6), 1215-1224. Optical Society of America (OSA) arXiv. Cornell University Library
ISSN:	1084-7529 2331-8422
Popis:	We apply the Lie algebraic method to reflecting optical systems with plane-symmetric freeform mirrors. Using analytical ray-tracing equations we construct an optical map. The expansion of this map gives us the aberration coefficients in terms of initial ray coordinates. The Lie algebraic method is applied to treat aberrations up to arbitrary order. The presented method provides a systematic and rigorous approach to the derivation, treatment and composition of aberrations in plane-symmetric systems. We give the results for second- and third-order aberrations and apply them to three single-mirror examples. Comment: 19 pages, 7 figures
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b0873ee19550290c9636bae2d58fbdd6 https://research.tue.nl/nl/publications/313acdbb-f9ac-49be-badb-ed7cc887b4f0 Zobrazit plný text záznamu