Verifying DiffEXAFS measurements with differential X-ray diffraction
| Autor: | M. P. Ruffoni, Sakura Pascarelli, Olivier Mathon, R. F. Pettifer |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Novel technique
Diffraction Nuclear and High Energy Physics Radiation Extended X-ray absorption fine structure Chemistry business.industry Local scale Reproducibility of Results Sensitivity and Specificity Thermal expansion Optics X-Ray Diffraction X-ray crystallography Scattering Radiation business Instrumentation Differential (mathematics) |
| Zdroj: | Journal of Synchrotron Radiation. 14:169-172 |
| ISSN: | 0909-0495 |
| DOI: | 10.1107/s0909049506049971 |
| Popis: | Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF(2). |
| Databáze: | OpenAIRE |
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