Development and Evaluation of a Leaf Disease Damage Extension in Cropsim-CERES Wheat
| Autor: | María Rosa Simón, William D. Batchelor, Simone Graeff-Hönninger, Ana Carolina Castro, Georg Röll |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
0106 biological sciences
Yield Mean squared error Cropsim-CERES Wheat 01 natural sciences Crop lcsh:Agriculture Septoria Crop modelling Yield (wine) Disease Cultivar Ciencias Agrarias Leaf area index Mathematics biology lcsh:S 04 agricultural and veterinary sciences biology.organism_classification Agronomy Leaf disease Wheat Septoria tritici blotch 040103 agronomy & agriculture Decision support system for agrotechnology transfer (DSSAT) 0401 agriculture forestry and fisheries PEST analysis Agronomy and Crop Science 010606 plant biology & botany |
| Zdroj: | Agronomy, Vol 9, Iss 3, p 120 (2019) Agronomy Volume 9 Issue 3 SEDICI (UNLP) Universidad Nacional de La Plata instacron:UNLP |
| Popis: | Developing disease models to simulate and analyse yield losses for various pathogens is a challenge for the crop modelling community. In this study, we developed and tested a simple method to simulate septoria tritici blotch (STB) in the Cropsim-CERES Wheat model studying the impacts of damage on wheat (Triticum aestivum L.) yield. A model extension was developed by adding a pest damage module to the existing wheat model. The module simulates the impact of daily damage on photosynthesis and leaf area index. The approach was tested on a two-year dataset from Argentina with different wheat cultivars. The accuracy of the simulated yield and leaf area index (LAI) was improved to a great extent. The Root mean squared error (RMSE) values for yield (1144 kg ha&minus 1) and LAI (1.19 m2 m&minus 2) were reduced by half (499 kg ha&minus 1) for yield and LAI (0.69 m2 m&minus 2). In addition, a sensitivity analysis of different disease progress curves on leaf area index and yield was performed using a dataset from Germany. The sensitivity analysis demonstrated the ability of the model to reduce yield accurately in an exponential relationship with increasing infection levels (0&ndash 70%). The extended model is suitable for site specific simulations, coupled with for example, available remote sensing data on STB infection. |
| Databáze: | OpenAIRE |
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