Determining the chronological sequence of inks deposited with different writing and printing tools using ion beam analysis
Autor: | Mauricio A. Sortica, Vairavel Mathayan, Daniel Primetzhofer |
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Rok vydání: | 2021 |
Předmět: |
particle
Materials science Particle-induced X-ray emission Physical Chemistry 01 natural sciences Rutherford backscattering spectrometry Pathology and Forensic Medicine law.invention 03 medical and health sciences 0302 clinical medicine Optics sequence of inks law induced X-ray emission Genetics Deposition (phase transition) ink discrimination 030216 legal & forensic medicine Fysikalisk kemi Profiling (computer programming) Ion beam analysis business.industry 010401 analytical chemistry Laser 0104 chemical sciences ink composition Focus (optics) business Beam (structure) |
Zdroj: | Journal of Forensic Sciences. |
ISSN: | 1556-4029 0022-1198 |
Popis: | Determining the sequence of inks in a questioned document is important in forensic science. Conventional and micro beam-based ion beam analysis using Rutherford backscattering spectrometry (RBS) and particle-induced X-ray emission were employed to study the depth distribution of chemical elements in plain paper and inks/toner deposited by different pens as well as inkjet and laser printers. Composition depth profiling with high lateral resolution was performed with focus on areas where two different coloring agents overlapped. We identify under which conditions the sequence of inks deposited can be reconstructed, analyzing the continuity of characteristic contributions to the obtained signals, with a focus on the depth-resolved RBS data. The order of deposition was correctly determined for combinations of two different laser printers and in certain cases for pens. Results indicate a potential for analysis, depending on the composition of staining agent, that is, in particular if heavy species are present in sufficiently high concentration. In such cases, also characters obscured or modified by an agent of different composition can be revealed. Changing the probing depth by modifying the beam energy could yield additional information. |
Databáze: | OpenAIRE |
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