Structure of freely suspended chiral smectic films as determined by x-ray reflectivity and optical ellipsometry

Autor:	Boris I. Ostrovskii, Christian Bahr, D. Schlauf, A. Fera, W. H. de Jeu, Ricarda Opitz
Rok vydání:	2001
Předmět:	Physics X-ray reflectivity Crystallography Nuclear magnetic resonance Ellipsometry Liquid crystalline ddc:530 Clock model Reflectivity Helix structure
Zdroj:	Physical review / E 64(2), 021702 (2001). doi:10.1103/PhysRevE.64.021702
ISSN:	1539-3755
DOI:	10.1103/PhysRevE.64.021702
Popis:	Physical review / E 64(2), 021702 (2001). doi:10.1103/PhysRevE.64.021702 Published by Inst., Woodbury, NY
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::af7238244a49443a9ba2089da4aa0019 https://pubmed.ncbi.nlm.nih.gov/11497603 Zobrazit plný text záznamu