Piezoelectric and non-linear optical properties of α-quartz type Si1−xGexO2 single crystals
| Autor: | M. Cambon, Julien Haines, Alain Largeteau, Bernard Hehlen, Olivier Cambon, Patrick Hermet, D. Clavier, M. Prakasam, J. J. Boy |
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| Přispěvatelé: | Institut Charles Gerhardt Montpellier - Institut de Chimie Moléculaire et des Matériaux de Montpellier (ICGM ICMMM), Ecole Nationale Supérieure de Chimie de Montpellier (ENSCM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Université Montpellier 1 (UM1)-Université Montpellier 2 - Sciences et Techniques (UM2)-Institut de Chimie du CNRS (INC), Institut de Chimie de la Matière Condensée de Bordeaux (ICMCB), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université de Bordeaux (UB), Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Coulomb (L2C), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), ANR ASTRID, Université Montpellier 2 - Sciences et Techniques (UM2)-Université Montpellier 1 (UM1)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Ecole Nationale Supérieure de Chimie de Montpellier (ENSCM), Université Montpellier 1 (UM1)-Université Montpellier 2 - Sciences et Techniques (UM2)-Ecole Nationale Supérieure de Chimie de Montpellier (ENSCM)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
[SPI.OTHER]Engineering Sciences [physics]/Other
Materials science Annealing (metallurgy) Infrared Analytical chemistry Crystal growth 02 engineering and technology General Chemistry [CHIM.MATE]Chemical Sciences/Material chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Piezoelectricity 0104 chemical sciences Crystal Crystallography Nonlinear system General Materials Science Density functional theory 0210 nano-technology Quartz |
| Zdroj: | CrystEngComm CrystEngComm, Royal Society of Chemistry, 2016, 18 (14), pp.2500-2508. ⟨10.1039/C5CE02477C⟩ CrystEngComm, Royal Society of Chemistry, 2016, 18 (14), pp.2500-2508 |
| ISSN: | 1466-8033 |
| DOI: | 10.1039/C5CE02477C⟩ |
| Popis: | International audience; Single crystals of α-quartz type Si1−xGexO2 with x < 0.2 were grown in 0.05 M NaOH solution. Infrared measurements confirmed that crystals grown at high pressure and high temperature have a low –OH group defect content. After a few millimeters of crystal growth under these conditions, α3500 reaches 0.1 cm−1 and no free –OH are present. The d11 value measured on an X-cut from the crystal with x = 0.0375 is 3.08 pC N−1 (±0.15), in good agreement with the value of 2.97 pC N−1 obtained using density functional theory based calculations. Piezoelectric measurements were performed on the Si1−xGexO2 crystal with x = 0.0375, both at room temperature and after annealing at various temperatures. The piezoelectric signal of the crystal with x = 0.0375 and pure SiO2 disappears after annealing at 635 °C and 545 °C, respectively. Nonlinear optical (NLO) properties of Si1−xGexO2 crystals were measured by Maker's fringe technique on Z-cut χ11(2) and their corresponding values for x = 0.023 and 0.028 are 1.3(2) pm V−1 and 1.6(2) pm V−1, respectively. These values are in good agreement with density functional theory based calculations. The light induced damage threshold values measured on Si1−xGexO2 crystals with x = 0.023 and 0.028 are very similar to that of α-quartz. |
| Databáze: | OpenAIRE |
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