ASIC implementation of random number generators using SR latches and its evaluation
Autor: | Hirotaka Kokubo, Kouichi Itoh, Dai Yamamoto, Tsutomu Matsumoto, Masahiko Takenaka, Naoya Torii |
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Jazyk: | angličtina |
Předmět: |
Independent and identically distributed random variables
Random number generation business.industry Computer science 020208 electrical & electronic engineering 02 engineering and technology General Medicine Environmental stress 020202 computer hardware & architecture Application-specific integrated circuit Power consumption Embedded system 0202 electrical engineering electronic engineering information engineering business Field-programmable gate array Computer hardware Voltage Statistical hypothesis testing |
Zdroj: | EURASIP Journal on Information Security. 2016(1) |
ISSN: | 1687-417X |
DOI: | 10.1186/s13635-016-0036-1 |
Popis: | A true random number generator (TRNG) is proposed and evaluated by field-programmable gate arrays (FPGA) implementation that generates random numbers by exclusive-ORing (XORing) the outputs of many SR latches (Hata and Ichikawa, IEICE Trans. Inf. Syst. E95-D(2):426---436, 2012). This enables compact implementation and generates high-entropy random numbers. In this paper, we fabricate and evaluate 39 TRNGs using SR latches on 0.18 μm ASICs. Random numbers are generated by XORing the outputs of 256 SR latches. Our TRNGs pass the SP800-90B health tests and the AIS20/31 statistical tests in changing temperatures (from ?20 to 60 °C) and voltages (1.80 ± 0.15 V). We also perform an independent and identically distributed (IID) test and calculate min-entropy according to the SP800-90B. With these tests, we are able to confirm that our TRNGs are highly robust against environmental stress. The power consumption and circuit scale of our TRNGs are 0.27 mW and 1240.5 gates, respectively. Our TRNGs that use SR latches are small enough to be implemented in embedded devices. |
Databáze: | OpenAIRE |
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