Grenoble Large Scale Facilities for advanced characterisation of microelectronics devices
| Autor: | J. Beaucour, J. Segura-Ruiz, Maud Baylac, B. Giroud, Francesca Villa, Solenne Rey, E. Capria, E. Mitchell, C. Curfs, J. C. Royer |
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| Přispěvatelé: | Institut Laue-Langevin (ILL), ILL, European Synchrotron Radiation Facility (ESRF), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire de Physique Subatomique et de Cosmologie (LPSC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS), GENEPI2, Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Engineering
010308 nuclear & particles physics business.industry Scale (chemistry) [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph] Electrical engineering reliability tomography 7. Clean energy 01 natural sciences failure analysis 0103 physical sciences Systems engineering devices characterisation Microelectronics business Neutron irradiation neutron irradiation thermal neutrons |
| Zdroj: | Conference on Radiation Effects on Components and Systems (RADECS 2015) Conference on Radiation Effects on Components and Systems (RADECS 2015), Sep 2015, Moscow, Russia. IEEE, Proceedings of the 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015, pp.1-4, 2015, ⟨10.1109/RADECS.2015.7365616⟩ |
| Popis: | IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP15449-CDR (CD-ROM) ISBN: 978-1-5090-0230-6 (CD-ROM) IEEE Catalog Number: CFP15449-PRT (PRINT) ISBN: 978-1-5090-0231-3 (PRINT); International audience; The French IRT-nanoelec consortium in collaboration with GENEPI2 acceleratoris offering world unique and complementary techniques for Hirel componentscharacterization. Part of this capability is the high and low (thermal) energyneutron testing of devices. |
| Databáze: | OpenAIRE |
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