Which Pattern for a Low Pattern-Induced Bias?

Autor: Frédéric Sur, Benoît Blaysat, Michel Grédiac
Přispěvatelé: Recalage visuel avec des modèles physiquement réalistes (TANGRAM), Inria Nancy - Grand Est, Institut National de Recherche en Informatique et en Automatique (Inria)-Institut National de Recherche en Informatique et en Automatique (Inria)-Université de Lorraine (UL)-Department of Algorithms, Computation, Image and Geometry (LORIA - ALGO), Laboratoire Lorrain de Recherche en Informatique et ses Applications (LORIA), Institut National de Recherche en Informatique et en Automatique (Inria)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche en Informatique et en Automatique (Inria)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Laboratoire Lorrain de Recherche en Informatique et ses Applications (LORIA), Institut National de Recherche en Informatique et en Automatique (Inria)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS), Institut Pascal (IP), Centre National de la Recherche Scientifique (CNRS)-Université Clermont Auvergne (UCA)-Institut national polytechnique Clermont Auvergne (INP Clermont Auvergne), Université Clermont Auvergne (UCA)-Université Clermont Auvergne (UCA), Sharlotte L.B. Kramer, Rachael Tighe, Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang
Rok vydání: 2022
Předmět:
Zdroj: Thermomechanics & Infrared Imaging, Inverse Problem Methodologies, Mechanics of Additive & Advanced Manufactured Materials, and Advancements in Optical Methods & Digital Image Correlation, Volume 4 ISBN: 9783030867447
Thermomechanics & Infrared Imaging, Inverse Problem Methodologies, Mechanics of Additive & Advanced Manufactured Materials, and Advancements in Optical Methods & Digital Image Correlation, Volume 4
Sharlotte L.B. Kramer, Rachael Tighe, Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang. Thermomechanics & Infrared Imaging, Inverse Problem Methodologies, Mechanics of Additive & Advanced Manufactured Materials, and Advancements in Optical Methods & Digital Image Correlation, Volume 4, Springer International Publishing, pp.103-105, 2022, Conference Proceedings of the Society for Experimental Mechanics Series, ⟨10.1007/978-3-030-86745-4_15⟩
Popis: International audience; The first objective of this presentation is to show that it is possible to explain the cause of the pattern-induced bias (PIB) observed in displacement fields obtained by local DIC. A model is presented for this purpose. It gathers the different errors made when retrieving this displacement by minimizing the optical residual over subsets. It is shown that PIB predicted with this model and its counterpart observed with displacement fields obtained with DIC are in good agreement. When DIC is applied on periodic patterns like checkerboards instead of random speckles, it is observed that PIB becomes negligible. Such regular patterns are however not well suited for DIC. Hence it is recalled how to process such images by minimizing the optical residual in the Fourier domain instead of the spatial one. PIB is assessed in this case, and it is also observed that PIB is negligible in displacement maps obtained with such regular patterns processed by minimizing the optical residual in the Fourier domain.
Databáze: OpenAIRE