Scatter intensity mapping of laser-illuminated coating defects

Autor:	Mark B. Moran, R. H. Kuo, C. D. Marrs
Rok vydání:	2010
Předmět:	Materials science Scattering business.industry Materials Science (miscellaneous) Image processing Video microscopy Dielectric Laser Industrial and Manufacturing Engineering Light scattering law.invention Optics Optical coating law Microscopy Business and International Management business
Zdroj:	Applied optics. 27(5)
ISSN:	1559-128X
Popis:	The ability to detect and locate defects nondestructively in multilayer optical coatings has been demonstrated using a video microscopy system. The system uses laser-excited scattering to illuminate defects responsible for laser-induced damage in multilayer dielectric coatings. Intensity maps and contours can be generated by digitizing the video images of scattering from individual defects. These can reveal characteristic defect scatter features possibly related to damage probability, and they offer a means to follow the development of these features from incipient to catastrophic damage. Examples of defect scatter maps and intensity contours for an antireflection dielectric coated window are presented and discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::adc920a6ffea7ae65abcf38f30495fed https://pubmed.ncbi.nlm.nih.gov/20523714 Zobrazit plný text záznamu