Development of a soft UV-NIL steprepeat and lift-off process chain for high speed metal nanomesh fabrication

Autor: Hans Leichtfried, Manuel W. Thesen, Martin Messerschmidt, Michael J. Haslinger, Sonja Kopp, Tina Mitteramskogler, Michael Mühlberger
Rok vydání: 2020
Předmět:
Zdroj: Nanotechnology. 31(34)
ISSN: 1361-6528
Popis: In this work, we present a fabrication procedure of metal nanomesh arrays with the newly developed nanoimprint resist mr-NIL212FC used in a bi-layer resist system for a lift-off process. We comparatively analyzed and evaluated nanomeshes fabricated with a freshly prepared h-PDMS/PDMS stamp and a stamp used 501 times. Therefore, we first performed a step&repeat imprint test run in a self-built low cost step&repeat UV-NIL setup. We inspected the imprint behavior of the stamp, the UV-transmission through the stamp as well as stamp lifetime and stamp degradation with regard to the possible changes of its surface roughness. The nanomesh fabrication process is characterized by a good lift-off performance, leading to a low defect density of
Databáze: OpenAIRE