| Autor: |
Y.J. Wang, W.R. Graham, J.S. Iwanczyk |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
IEEE Conference on Nuclear Science Symposium and Medical Imaging. |
| DOI: |
10.1109/nssmic.1992.301186 |
| Popis: |
A laboratory study of HgI/sub 2/ spectrometers used for in-situ determination of lead on painted surfaces has been conducted. /sup 109/Cd and /sup 57/Co isotopes have been used to excite lead characteristic X-rays from samples. The energy resolution of HgI/sub 2/ detectors in the energy region corresponding to lead K X-rays has been measured. An energy resolution of 880 eV (FWHM) for the 60 keV line from an /sup 241/Am source has been obtained. Measurements using thin-film standards ranging from 0.5 mg Pb/cm/sup 2/ to 2 mg Pb/cm/sup 2/ have been conducted. Detection limits, accuracy, and precision of the measurements have been estimated. Based on a comparison of the results obtained with the performance of existing detector technology for hand-held X-ray lead analyzers, the HgI/sub 2/ detectors seem to be the best solution. A truly portable instrument for lead paint detection can be implemented by using HgI/sub 2/ detectors. Such an instrument can easily meet the requirement for a critical decision point of 1.0 mg Pb/cm/sup 2/, which is the regulatory limit for lead concentration in paints. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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