A CMOS-based Characterisation Platform for Emerging RRAM Technologies
| Autor: | Andrea Mifsud, Jiawei Shen, Peilong Feng, Lijie Xie, Chaohan Wang, Yihan Pan, Sachin Maheshwari, Shady Agwa, Spyros Stathopoulos, Shiwei Wang, Alexander Serb, Christos Papavassiliou, Themis Prodromakis, Timothy G. Constandinou |
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| Rok vydání: | 2022 |
| Předmět: |
FOS: Computer and information sciences
Emerging Technologies (cs.ET) Hardware_INTEGRATEDCIRCUITS FOS: Electrical engineering electronic engineering information engineering Computer Science - Emerging Technologies Hardware_PERFORMANCEANDRELIABILITY Systems and Control (eess.SY) Electrical Engineering and Systems Science - Systems and Control |
| Zdroj: | 2022 IEEE International Symposium on Circuits and Systems (ISCAS) |
| DOI: | 10.48550/arxiv.2205.08379 |
| Popis: | Mass characterisation of emerging memory devices is an essential step in modelling their behaviour for integration within a standard design flow for existing integrated circuit designers. This work develops a novel characterisation platform for emerging resistive devices with a capacity of up to 1 million devices on-chip. Split into four independent sub-arrays, it contains on-chip column-parallel DACs for fast voltage programming of the DUT. On-chip readout circuits with ADCs are also available for fast read operations covering 5-decades of input current (20nA to 2mA). This allows a device's resistance range to be between 1k$\Omega$ and 10M$\Omega$ with a minimum voltage range of $\pm$1.5V on the device. Comment: 5 pages. To be published in ISCAS 2022 and made available on IEEE Xplore |
| Databáze: | OpenAIRE |
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