Tin deposition on ruthenium and its influence on blistering in multi-layer mirrors

Autor: Shuxia Tao, Vianney Koelman, Geert Brocks, Thomas Morgan, Chidozie Onwudinanti
Přispěvatelé: Materials Simulation & Modelling, Computational Materials Physics, Electronic Structure Materials, Center for Computational Energy Research, Science and Technology of Nuclear Fusion, EIRES Chem. for Sustainable Energy Systems, EAISI Foundational, MESA+ Institute, Computational Materials Science
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Physical Chemistry Chemical Physics, 23, 13878-13884
Physical Chemistry Chemical Physics
Physical Chemistry Chemical Physics, 23(25), 13878-13884. Royal Society of Chemistry
Physical chemistry chemical physics, 23(25), 13878-13884. Royal Society of Chemistry
ISSN: 1463-9076
DOI: 10.1039/d1cp01082d
Popis: An atomistic description of tin deposition on ruthenium and its effect on blistering damage is of great interest in extreme ultraviolet (EUV) lithography. In EUV machines, tin debris from the EUV-emitting tin plasma may be deposited on the mirrors in the optical path. Tin facilitates the formation of hydrogen-filled blisters under the ruthenium top layer of the multi-layer mirrors. We have used Density Functional Theory (DFT) to show that tin deposition on a clean ruthenium surface exhibits a film-plus-islands (Stranski–Krastanov) growth mode, with the first atomic layer bonding strongly to the substrate. We find that a single tin layer allows hydrogen to reach the ruthenium surface and subsurface more easily than on clean ruthenium, but hydrogen penetration through the tin film becomes progressively more difficult when more layers are added. The results indicate that hydrogen penetration and blistering occur when only a thin layer of tin is present.
A monolayer of Sn makes the Ru surface more permeable to H, but more layers inhibit H penetration.
Databáze: OpenAIRE