The Surface Wave Scattering – Microwave Scanner (SWS-MS)
| Autor: | Bernard Lacroix, Jean Sébastien Bailly, Hervé Tortel, Maha Chamtouri, Olivier Merchiers, Rodolphe Vaillon, Amelie Litman, Mathieu Francoeur, Jean-Michel Geffrin |
|---|---|
| Přispěvatelé: | HIPE (HIPE), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), Centre d'Energétique et de Thermique de Lyon (CETHIL), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Radiative Energy Transfer Lab, Department of Mechanical Engineering, University of Utah, USA, University of Utah, Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Electromagnetic field
Physics Total internal reflection Radiation 010504 meteorology & atmospheric sciences Scattering business.industry Phase (waves) 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics Amplitude Optics Surface wave 0103 physical sciences Calibration [SPI.MECA.THER]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Thermics [physics.class-ph] business Spectroscopy Microwave 0105 earth and related environmental sciences |
| Zdroj: | Journal of Quantitative Spectroscopy and Radiative Transfer Journal of Quantitative Spectroscopy and Radiative Transfer, Elsevier, 2016, 168, pp. 1-9. ⟨10.1016/j.jqsrt.2015.08.019⟩ Journal of Quantitative Spectroscopy and Radiative Transfer, 2016, 168, pp. 1-9. ⟨10.1016/j.jqsrt.2015.08.019⟩ |
| ISSN: | 0022-4073 |
| DOI: | 10.1016/j.jqsrt.2015.08.019⟩ |
| Popis: | International audience; The Surface Wave Scattering-Microwave Scanner (SWS-MS) is a device that allows the measurement of the electromagnetic fields scattered by objects totally or partially submerged in surface waves. No probe is used to illuminate the sample, nor to guide or scatter the local evanescent waves. Surface waves are generated by total internal reflection and the amplitude and phase of the fields scattered by the samples are measured directly, both in the far-field and the near-field regions. The device’s principles and their practical implementation are described in details. The surface wave generator is assessed by measuring the spatial distribution of the electric field above the surface. Drift correction and the calibration method for far-field measurements are explained. Comparison of both far-field and near-field measurements against simulation data shows that the device provides accurate results. This work suggests that the SWS-MS can be used for producing experimental reference data, for supporting a better understanding of surface wave scattering, for assisting in the design of near-field optical or infrared systems thanks to the scale invariance rule in electrodynamics, and for performing nondestructive control of defects in materials. |
| Databáze: | OpenAIRE |
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