Investigation of cutting methods for small samples of Hayabusa and future sample return missions

Autor:	Yokoyama, Kaori, Takeda, Noboru, Uesugi, Masayuki, Noguchi, Ryo, Matsumoto, Tooru, Matsuno, Junya, Nagano, Takashi, Tsuchiyama, Akira, Harada, Shigenori, Yodo, Yoshiaki, Yada, Toru, Yakame, Shogo, Karouji, Yuzuru, Ishibashi, Yukihiro, Abe, Masanao, Okada, Tatsuaki, Fujimura, Akio, Ebihara, Mitsuru, Kitajima, Fumio, Nagao, Keisuke, Nakamura, Tomoki, Naraoka, Hiroshi, Noguchi, Takaaki, Okazaki, Ryuji, Yurimoto, Hisayoshi
Rok vydání:	2014
Předmět:	Geophysics Optics Materials science Space and Planetary Science business.industry Sample (material) Analytical chemistry Wafer dicing business Focused ion beam Aspect ratio (image)
Zdroj:	Meteoritics & Planetary Science. 49:1186-1201
ISSN:	1086-9379
DOI:	10.1111/maps.12322
Popis:	著者人数: 25名 Accepted: 2014-05-06 資料番号: SA1140109000
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::abd93858fc82d6d23d9b30f922638baf https://doi.org/10.1111/maps.12322 Zobrazit plný text záznamu Plný text