Automatic Detection of Defects on Periodically Patterned Textures
| Autor: | V. Asha, P. Nagabhushan, Nagappa U. Bhajantri |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Předmět: |
defect
Science periodicity Luminance Measure (mathematics) Matrix (mathematics) Artificial Intelligence Block (programming) Distortion Histogram cluster Eigendecomposition of a matrix Mathematics Discrete mathematics business.industry chi-square histogram universal quality index Pattern recognition QA75.5-76.95 Hierarchical clustering Electronic computers. Computer science Artificial intelligence eigen decomposition business Software Information Systems |
| Zdroj: | Journal of Intelligent Systems, Vol 20, Iss 3, Pp 279-303 (2011) |
| ISSN: | 0334-1860 |
| Popis: | Defect detection is a major concern in quality control of various products in industries. This paper presents two different machine-vision based methods for detecting defects on periodically patterned textures. In the first method, input defective image is split into several blocks of size same as the size of the periodic unit of the image and chi-square histogram distances of each periodic block with respect to itself and all other periodic blocks are calculated to get a dissimilarity matrix. This dissimilarity matrix is subjected to Ward's hierarchical clustering to automatically identify defective and defect-free blocks. The second method of defect detection is based on Universal Quality Index which is a measure of loss of correlation, luminance distortion and contrast distortion between any two signals. Quality indices of a periodic block with respect to itself and all other periodic blocks are calculated to get a similarity matrix containing quality indices. Specific variances of the periodic blocks are derived from the quality index matrix through orthogonal factor model based on eigen decomposition. These variances are subjected to Ward's hierarchical clustering to automatically identify defective and defect-free blocks. Results of experiments on real fabric images with defects show that the defect detection methods based on chi-square histogram distance and universal quality index yield a success rate of 98.6% and 97.8% respectively. |
| Databáze: | OpenAIRE |
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