Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
| Autor: | Zhongbo Lee, Martin Linck, Frank Kahl, Ute Kaiser, Johannes Biskupek, Maarten Bischoff, Harald Rose, Marcel Niestadt, Stephan Uhlemann, Max Haider, J. Zach, Tibor Lehnert, Heiko Müller, Felix Börrnert, Peter Hartel |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Microscope Aperture business.industry Resolution (electron density) General Physics and Astronomy Order (ring theory) 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences law.invention Spherical aberration Optics Transmission electron microscopy law 0103 physical sciences Chromatic aberration Chromatic scale 0210 nano-technology business |
| Zdroj: | Physical review letters. 117(7) |
| ISSN: | 1079-7114 |
| Popis: | Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic aberration deteriorates the resolution of the TEM image dramatically. Within the framework of the SALVE project, we introduce a newly developed ${C}_{c}/{C}_{s}$ corrector that is capable of correcting both the chromatic and the spherical aberration in the range of accelerating voltages from 20 to 80 kV. The corrector allows correcting axial aberrations up to fifth order as well as the dominating off-axial aberrations. Over the entire voltage range, optimum phase-contrast imaging conditions for weak signals from light atoms can be adjusted for an optical aperture of at least 55 mrad. The information transfer within this aperture is no longer limited by chromatic aberrations. We demonstrate the performance of the microscope using the examples of 30 kV phase-contrast TEM images of graphene and molybdenum disulfide, showing unprecedented contrast and resolution that matches image calculations. |
| Databáze: | OpenAIRE |
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