Correction to: Microstructural Characteristics of Oxide Layer Growth on Tin Whisker and Finish Surface

Autor:	Kyung‑Seob Kim, Jong‑Chang Woo
Rok vydání:	2019
Předmět:	Surface (mathematics) chemistry.chemical_compound Materials science chemistry Section (archaeology) Whisker Oxide Composite material Electrical and Electronic Engineering Layer (electronics) Amorphous solid Electronic Optical and Magnetic Materials
Zdroj:	Transactions on Electrical and Electronic Materials. 20:383-383
ISSN:	2092-7592 1229-7607
DOI:	10.1007/s42341-019-00129-3
Popis:	In the original publication of the article the sentence in the conclusions section that reads as “Both str crystalline and amorphous structures of SnO2 were observed” should read as “Both crystalline and amorphous structures of SnO2 were observed”.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a9cc140f580b673913e70f87b6891318 https://doi.org/10.1007/s42341-019-00129-3 Zobrazit plný text záznamu Full text from SpringerLink