Facet recovery and light emission from GaN/InGaN/GaN core-shell structures grown by metal organic vapour phase epitaxy on etched GaN nanorod arrays

Autor: Duncan W. E. Allsopp, Christopher J. Lewins, Alexander Satka, Robert W. Martin, Philip A. Shields, Paul R. Edwards, Ionut Girgel, E. D. Le Boulbar
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Le Boulbar, E D, Girgel, I, Lewins, C J, Edwards, P R, Martin, R W, Šatka, A, Allsopp, D W E & Shields, P A 2013, ' Facet recovery and light emission from GaN/InGaN/GaN core-shell structures grown by metal organic vapour phase epitaxy on etched GaN nanorod arrays ', Journal of Applied Physics, vol. 114, no. 9, 094302 . https://doi.org/10.1063/1.4819440
Journal of Applied Physics
DOI: 10.1063/1.4819440
Popis: The use of etched nanorods from a planar template as a growth scaffold for a highly regular GaN/InGaN/GaN core-shell structure is demonstrated. The recovery of m-plane non-polar facets from etched high-aspect-ratio GaN nanorods is studied with and without the introduction of a hydrogen silsesquioxane passivation layer at the bottom of the etched nanorod arrays. This layer successfully prevented c-plane growth between the nanorods, resulting in vertical nanorod sidewalls (∼89.8°) and a more regular height distribution than re-growth on unpassivated nanorods. The height variation on passivated nanorods is solely determined by the uniformity of nanorod diameter, which degrades with increased growth duration. Facet-dependent indium incorporation of GaN/InGaN/GaN core-shell layers regrown onto the etched nanorods is observed by high-resolution cathodoluminescence imaging. Sharp features corresponding to diffracted wave-guide modes in angle-resolved photoluminescence measurements are evidence of the uniformity of the full core-shell structure grown on ordered etched nanorods.
Databáze: OpenAIRE