Edge-on face-to-face MOSFET for synchrotron microbeam dosimetry: MC modeling
| Autor: | Tomas Kron, E.A. Siegbahn, Michael L. F Lerch, Alberto Bravin, George J. Takacs, Iwan Cornelius, H. Nettelback, Anatoly B. Rosenfeld, E. Brauer-Krish, N. Painuly, A. Holmes-Siedle |
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| Přispěvatelé: | Rosenfeld, A, Siegbahn, E, Brauer-Krish, E, Holmes-Siedle, A, Lerch, M, Bravin, A, Cornelius, I, Takacs, G, Painuly, N, Nettelback, H, Kron, T |
| Rok vydání: | 2005 |
| Předmět: |
Nuclear and High Energy Physics
medicine.medical_specialty Monte Carlo method FIS/07 - FISICA APPLICATA (A BENI CULTURALI AMBIENTALI BIOLOGIA E MEDICINA) Dose enhancement effects (DEEs) Die (integrated circuit) Synchrotron law.invention MOSFET Optics law Dosimetry Microbeam medicine Medical physics Electrical and Electronic Engineering Physics Radiotherapy business.industry Detector Nuclear Energy and Engineering Charged-particle equilibrium (CPE) business Beam (structure) |
| Zdroj: | IEEE Transactions on Nuclear Science. 52:2562-2569 |
| ISSN: | 0018-9499 |
| DOI: | 10.1109/tns.2005.860704 |
| Popis: | The dosimetry of X-ray microbeams using MOSFETs results in an asymmetrical beam profile due to a lack of lateral charged particle equilibrium. Monte Carlo simulations were carried out using PENELOPE and GEANT4 codes to study this effect and a MOSFET on a micropositioner was scanned in the microbeam. Based on the simulations a new method of microbeam dosimetry is proposed. The proposed edge-on face-to-face (EOFF) MOSFET detector, a die arrangement proposed here for the first time, should alleviate the asymmetry. Further improvement is possible by thinning the silicon body of the MOSFET. |
| Databáze: | OpenAIRE |
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