Pseudo-gray-scale halftone gratings for shearing and Hartmann wavefront sensors
| Autor: | Kenneth A. Goldberg |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Wavefront
Diffraction Shearing (physics) Quantum Physics Halftone Materials science business.industry Phase (waves) X-ray optics Optics Optical Physics 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics Interferometry 0103 physical sciences Electrical and Electronic Engineering 0210 nano-technology business Beam (structure) |
| Zdroj: | Optics letters, vol 46, iss 4 |
| ISSN: | 1539-4794 |
| Popis: | Now in use on x-ray beamlines worldwide, shearing interferometry and Hartmann wavefront sensing provide effective feedback for measuring and optimizing high-quality beams. Conventionally, both approaches spatially modulate the beam properties (amplitude or phase) using two-tone, binary patterns, leading to deleterious diffraction effects that must be mitigated. In shearing, the presence of multiple diffraction orders affects measurement near boundaries. In Hartmann, diffraction limits the measurement point density. We demonstrate that the use of pseudo-gray-scale halftone patterns in the diffracting elements can improve the performance of both techniques. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|