Diffraction peaks restoration and extraction in energy dispersive X-ray diffraction
| Autor: | Charles Crespy, Ferréol Soulez, Philippe Duvauchelle, Valerie Kaftandjian |
|---|---|
| Přispěvatelé: | Controle Non Destructif par Rayonnements Ionisants (CNDRI), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon, ANR-07-SECU-0008,SPIDERS,Système Portable d'Inspection par RX pour la Détection et l'identification des Explosifs et Risques chimiques pour la Sécurité(2007) |
| Rok vydání: | 2011 |
| Předmět: |
Diffraction
Physics Nuclear and High Energy Physics Photon business.industry Detector inverses problems 01 natural sciences Spectral line 010309 optics Optics [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing Non Destructive Testing 0103 physical sciences Energy Dispersive X ray Diffraction Angular resolution Graphite spectrum restoration Energy-dispersive X-ray diffraction 010306 general physics business [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing Instrumentation Electron backscatter diffraction |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2011, pp.10.1016/j.nima.2011.06.037. ⟨10.1016/j.nima.2011.06.037⟩ |
| ISSN: | 0168-9002 |
| DOI: | 10.1016/j.nima.2011.06.037 |
| Popis: | International audience; This paper proposes a method to restore energy dispersive X-ray diffraction (EDXRD) spectra and to extract diffraction peaks. It follows a maximum a posteriori approach using a physical model of the formation of the EDXRD data to remove blur caused by both the detector and the coarse angular resolution of X-ray tube based EDXRD setups. It separates peaks caused by the diffraction by crystalline material from a countinuous background. Tested on real data (graphite and NaCl), our algorithm acheived to detect diffraction peaks with a good precision (about 1 keV depending on the peak position) even at high energy where very few photons were measured. |
| Databáze: | OpenAIRE |
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