Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage
| Autor: | J. Busenbergs, D. Merkulovs, O. Vilitis, Martins Rutkis |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Kelvin probe force microscope Materials science surface potential business.industry System of measurement Physics QC1-999 Composite number General Engineering General Physics and Astronomy 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Optics contact potential difference kelvin probe 0103 physical sciences 0210 nano-technology business Volta potential Voltage |
| Zdroj: | Latvian Journal of Physics and Technical Sciences, Vol 53, Iss 6, Pp 57-66 (2016) |
| ISSN: | 0868-8257 |
| Popis: | The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail. |
| Databáze: | OpenAIRE |
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