Ordered Oxide Surfaces on Metals: Chromium Oxide
| Autor: | Richard Landers, George G. Kleiman, Marcelo Falsarella Carazzolle, A. Pancotti, Abner de Siervo |
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| Přispěvatelé: | San Luis Conference on Surfaces, Interfaces and Catalysis (5. : 9 a 19 de Abril de 2010 : São Pedro, SP), UNIVERSIDADE ESTADUAL DE CAMPINAS |
| Rok vydání: | 2011 |
| Předmět: |
Diffraction
Materials science Annealing (metallurgy) Raios X - Difração Oxide Analytical chemistry Oxides - Surfaces Synchrotron radiation Catalysis Óxidos - Superfícies chemistry.chemical_compound X-ray photoelectron spectroscopy Photoelectron - Diffraction Low-energy electron diffraction Scattering General Chemistry Radiação sincrotrônica Artigo de evento Crystallography chemistry Model catalyst Fotoelétrons - Difração X-rays - Diffraction X-ray photoelectron diffraction |
| Zdroj: | Repositório da Produção Científica e Intelectual da Unicamp Universidade Estadual de Campinas (UNICAMP) instacron:UNICAMP |
| ISSN: | 1572-9028 1022-5528 |
| DOI: | 10.1007/s11244-011-9628-7 |
| Popis: | Agradecimentos: The authors would like to thank FAPESP, CNPq, CAPES and LNLS of Brasil for support Abstract: We present X-ray photoelectron spectroscopy (XPS) and X-ray photoelectron diffraction (XPD) investigations of ordered chromium oxide ultrathin films prepared on a Pd(111) single-crystal surface. The films where grown by thermal evaporation of Cr under an oxygen atmosphere and sample temperature of 600 K. The ordered films produced are strongly dependent on the film thickness and annealing treatment. Films with thickness below 5 A?, produced at low coverages, display a p(2 x 2) structure relative to Pd(111). Thicker films (thickness>10 A?) always have a ( ?3 p x ?3 p) R30° structure. The photoemission measurements were done using conventional X-ray sources as well as synchrotron radiation taken at the Laboratório Nacional de Luz Síncrotron. The XPD data were interpreted through the use of a multiple scattering calculation approach combined with a genetic algorithm for surface structure optimization. Combining the information from XPS, low energy electron diffraction and XPD measurements we have determined the surface structure of the ( ?3 p x ?3 p) R30° phase. Elsewhere, we report on the structure of the p(2 x 2) phase FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ COORDENAÇÃO DE APERFEIÇOAMENTO DE PESSOAL DE NÍVEL SUPERIOR - CAPES Fechado |
| Databáze: | OpenAIRE |
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