Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting
| Autor: | N. Krishna Mohan, Basanta Bhaduri, Mahendra P. Kothiyal |
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| Rok vydání: | 2007 |
| Předmět: |
Aperture
Fringe analysis Rotation Displacement (vector) Speckle pattern Optics Electronic speckle pattern interferometry Sensitivity (control systems) Phase shift Electrical and Electronic Engineering Physical and Theoretical Chemistry Digital speckle pattern interferometry (DSPI) Lighting Physics business.industry Light scattering Real time systems Image plane Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Interferometry Image planes Spatial phase shifting Sensitivity analysis business |
| Zdroj: | Optics Communications. 272:9-14 |
| ISSN: | 0030-4018 |
| DOI: | 10.1016/j.optcom.2006.11.012 |
| Popis: | This paper presents a real-time digital speckle pattern interferometry system with twofold increase in sensitivity for the measurement of in-plane displacement and first order derivative of out-of-plane displacement (slope). Spatial phase shifting technique has been used for quantitative fringe analysis. The system employs a double aperture arrangement in front of the imaging system that introduces spatial carrier fringes within the speckle for spatial phase shifting. For in-plane displacement measurement, the scattered fields from the object are collected independently along the direction of illumination beams, and combined at the image plane. For slope measurement, a shear is introduced between the two scattered fields. Experimental results on an edge clamped circular plate subjected to in-plane rotation for in-plane displacement measurement and central loading for slope measurement are presented. � 2006 Elsevier B.V. All rights reserved. |
| Databáze: | OpenAIRE |
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