Photon scanning tunneling microscope in combination with a force microscope
| Autor: | M.H.P. Moers, R. G. Tack, N. F. van Hulst, B. Bölger |
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| Přispěvatelé: | Optical Sciences |
| Rok vydání: | 1994 |
| Předmět: |
Scanning Hall probe microscope
Microscope Photon Materials science business.industry Physics::Optics General Physics and Astronomy Conductive atomic force microscopy Electrochemical scanning tunneling microscope law.invention Indium tin oxide Condensed Matter::Materials Science Optics law Magnetic force microscope Scanning tunneling microscope business |
| Zdroj: | Journal of Applied Physics, 75(3), 1254-1257. American Institute of Physics |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.356428 |
| Popis: | The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir-Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit |
| Databáze: | OpenAIRE |
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