| Autor: |
M. J. Regan, Moshe Deutsch, Lonny E. Berman, Peter S. Pershan, Olaf M. Magnussen, B. M. Ocko |
| Rok vydání: |
1996 |
| Předmět: |
|
| Zdroj: |
Physical review. B, Condensed matter. 54(14) |
| ISSN: |
0163-1829 |
| Popis: |
The temperature dependence of surface-induced atomic layering in liquid gallium has been investigated with x-ray reflectivity. The prominent layering peak at {ital q}{sub {ital z}}=2.4 A{sup {minus}1} decreases dramatically upon heating from 22 to 170{degree}C, but its width stays, unexpectedly, unchanged. The decrease is traced to the temperature dependence of capillary-wave induced surface roughness. The constant width indicates a temperature-independent layering decay length. The measured layering amplitudes are found to be significantly underestimated by existing theory and molecular simulations. {copyright} {ital 1996 The American Physical Society.} |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
