Extreme Ultraviolet Frequency Comb Metrology
| Autor: | Christoph Gohle, Kjeld S. E. Eikema, D. Z. Kandula, T. J. Pinkert, Wim Ubachs |
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| Přispěvatelé: | Atoms, Molecules, Lasers, LaserLaB - Physics of Light |
| Rok vydání: | 2010 |
| Předmět: |
Atomic Physics (physics.atom-ph)
FOS: Physical sciences Physics::Optics General Physics and Astronomy chemistry.chemical_element Phase detector Physics - Atomic Physics law.invention Frequency comb Optics law Physics::Atomic and Molecular Clusters SDG 7 - Affordable and Clean Energy Physics::Atomic Physics Helium Physics business.industry Laser Metrology Wavelength chemistry Extreme ultraviolet Femtosecond business |
| Zdroj: | Physical Review Letters, 105. American Physical Society Kandula, D Z, Gohle, C, Pinkert, T J, Ubachs, W M G & Eikema, K S E 2010, ' Extreme ultraviolet frequency comb metrology ', Physical Review Letters, vol. 105, pp. 063001 . https://doi.org/10.1103/PhysRevLett.105.063001 |
| ISSN: | 1079-7114 0031-9007 |
| DOI: | 10.1103/physrevlett.105.063001 |
| Popis: | The remarkable precision of frequency comb (FC) lasers is transferred to the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), a frequency region previously not accessable to these devices. A frequency comb at XUV wavelengths near 51 nm is generated by amplification and coherent upconversion of a pair of pulses originating from a near-infrared femtosecond FC laser. The phase coherence of the source in the XUV is demonstrated using Helium atoms as a ruler and phase detector. Signals in the form of stable Ramsey-like fringes with high contrast are observed when the FC laser is scanned over P states of Helium, from which the absolute transition frequency in the XUV can be extracted. This procedure yields a 4He ionization energy at h 5945204212(6) MHz, improved by nearly an order of magnitude in accuracy, thus challenging QED calculations of this two-electron system. Comment: 4 pages, 3 figures, acknowledgements added, fixed typos |
| Databáze: | OpenAIRE |
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