Influence of strain relaxation on the structural stabilization of SmNiO3 films epitaxially grown on (001) SrTiO3 substrates
| Autor: | Jean-Louis Hodeau, Cécile Girardot, Eric Dooryhee, Jens Kreisel, François Weiss, Florine Conchon, René Guinebretière, S. Pignard, Alexandre Boulle |
|---|---|
| Přispěvatelé: | Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Matériaux, Rayonnements, Structure (MRS), Institut Néel (NEEL), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS) |
| Rok vydání: | 2007 |
| Předmět: |
010302 applied physics
Diffraction rare-earth nickelates films Materials science Mechanical Engineering Non-blocking I/O strain relaxation Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Epitaxy 01 natural sciences Dissociation (chemistry) Crystallography Lattice constant x-ray diffraction Mechanics of Materials 0103 physical sciences X-ray crystallography General Materials Science Nanometre 0210 nano-technology Chemical composition |
| Zdroj: | Materials Science and Engineering: B Materials Science and Engineering: B, Elsevier, 2007, 144, pp.32-37. ⟨10.1016/j.mseb.2007.07.096⟩ |
| ISSN: | 0921-5107 |
| DOI: | 10.1016/j.mseb.2007.07.096 |
| Popis: | The structural stabilization of SmNiO3 (SNO) films epitaxially grown by an injection MO-CVD process on (0 0 1) SrTiO3 (STO) substrates is investigated. Using high-resolution X-ray diffraction (XRD), we show that SNO can be stabilized on STO with a minor amount of secondary phases and with a layer thickness reaching several hundreds of nanometers. The film quality is discussed by means of the simulation of X-ray reflectivity and XRD profiles that evidence smooth surfaces and interfaces. The actual lattice parameter of bulk (i.e. strain free) SNO is calculated as a function of the deposited thickness. It turns out firstly that the stabilization of SNO is achieved because the lattice mismatch between STO and SNO is not as high as expected (1.6% instead of 2.8%) and secondly the layer chemical composition varies with the film thickness. Finally, the well-known dissociation of the SNO phase into NiO and Sm2O3 is clearly correlated to the relaxation of epitaxial strain. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect