Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time
| Autor: | Mauro E. Ferreira, Dai Tang, Petrus Christiaan Pistorius |
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| Rok vydání: | 2017 |
| Předmět: |
Materials science
Scanning electron microscope business.industry Image quality Scanning confocal electron microscopy 02 engineering and technology Microanalysis Acceleration voltage Signal 020501 mining & metallurgy Optics 0205 materials engineering Energy filtered transmission electron microscopy business Instrumentation Image resolution |
| Zdroj: | Microscopy and Microanalysis. 23:1082-1090 |
| ISSN: | 1435-8115 1431-9276 |
| Popis: | Automated inclusion microanalysis in steel samples by computer-based scanning electron microscopy provides rapid quantitative information on micro-inclusion distribution, composition, size distribution, morphology, and concentration. Performing the analysis at a lower accelerating voltage (10 kV), rather than the generally used 20 kV, improves analysis accuracy and may improve spatial resolution, but at the cost of a smaller backscattered electron signal and potentially smaller rate of generation of characteristic X-rays. These effects were quantified by simulation and practical measurements. |
| Databáze: | OpenAIRE |
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