Use of interface phonon-polaritons for the alloy determination in ZnO/(Zn,Mg)O multiple quantum wells
| Autor: | E. Martínez Castellano, Adrian Hierro, Miguel Montes Bajo, Julen Tamayo-Arriola, Denis Lefebvre, Maxime Hugues, N. Le Biavan, J. M. Chauveau |
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| Přispěvatelé: | Centre de recherche sur l'hétéroepitaxie et ses applications (CRHEA), Université Nice Sophia Antipolis (... - 2019) (UNS), COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-Centre National de la Recherche Scientifique (CNRS)-Université Côte d'Azur (UCA) |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Composition-dependent phonon frequency
Materials science Phonon Reflectance spectroscopy Multiple quantum Alloy Analytical chemistry General Physics and Astronomy Cathodoluminescence 02 engineering and technology engineering.material 01 natural sciences Spectral line 0103 physical sciences Calibration Polariton Interface phonon polariton ComputingMilieux_MISCELLANEOUS 010302 applied physics [PHYS]Physics [physics] Surfaces and Interfaces General Chemistry Alloy determination 021001 nanoscience & nanotechnology Condensed Matter Physics ZnO Quantum wells Surfaces Coatings and Films engineering Longitudinal optical 0210 nano-technology |
| Zdroj: | Applied Surface Science Applied Surface Science, Elsevier, 2021, 567, pp.150816. ⟨10.1016/j.apsusc.2021.150816⟩ Applied Surface Science, 567 |
| ISSN: | 0169-4332 1873-5584 |
| DOI: | 10.1016/j.apsusc.2021.150816⟩ |
| Popis: | A method based on infrared reflectance spectroscopy is presented by which the Mg content in ZnO/(Zn,Mg)O multiple quantum wells with very thin barriers can be determined. The method relies on the observation of interface phonon-polaritons which appear as sharp dips in the p-polarized reflectance spectra at oblique incidence near the longitudinal optical (LO)-phonon frequencies of both QW and barrier materials. By fitting the reflectance spectra to a dielectric function model, the LO phonon frequency of the (Zn,Mg)O barrier layers can be determined. The LO phonon frequency depends on the Mg content. Comparing to Mg content calibration via cathodoluminescence, a linear relationship between the reflectance dip frequency and the Mg content is obtained. The presented method serves as a rapid means to determine the Mg content on final structures with very thin (Zn,Mg)O layers-such as device structures-where alternative, destructive methods cannot be used. Applied Surface Science, 567 ISSN:0169-4332 ISSN:1873-5584 |
| Databáze: | OpenAIRE |
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