Cadmium O-alkylxanthates as CVD precursors of CdS: a chemical characterization
| Autor: | Davide Barreca, Roberta Seraglia, Alberto Gasparotto, Cinzia Maragno, Venkata Krishnan, Eugenio Tondello, Alfonso Venzo, Helmut Bertagnolli |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2005 |
| Předmět: |
chemistry.chemical_classification
Cadmium Sulfide Extended X-ray absorption fine structure Inorganic chemistry cadmium(II)bis(O-alkylxanthates) CdS EXAFS NMR mass-spectrometry chemistry.chemical_element General Chemistry Chemical vapor deposition Mass spectrometry Inorganic Chemistry symbols.namesake chemistry symbols Thin film Thermal analysis Raman spectroscopy |
| Zdroj: | Applied organometallic chemistry 19 (2005): 59–67. doi:10.1002/aoc.833 info:cnr-pdr/source/autori:1-Barreca D.; 2-Gasparotto A.; 2-Maragno C.; 1-Seraglia R.; 2-Tondello E.; 1-Venzo A.; 3-Krishnan V.; 3-Bertagnolli H./titolo:Cadmium O-alkylxanthates as CVD precursors of CdS: a chemical characterization/doi:10.1002%2Faoc.833/rivista:Applied organometallic chemistry/anno:2005/pagina_da:59/pagina_a:67/intervallo_pagine:59–67/volume:19 |
| DOI: | 10.1002/aoc.833 |
| Popis: | Cadmium bis(O-alkylxanthates) are potential single-source molecular precursors for the chemical vapor deposition (CVD) of Cd(II) sulfide thin films. In this work, a multi-technique characterization of Cd(O-RXan)2 compounds [where O-RXan is CH3CH2OCS2 (O-EtXan) or (CH3)2CHOCS2 (O-iPrXan)] is performed by means of several analytical methods (extended x-ray absorption fine structure, Raman, Fourier transform infrared and optical absorption, spectroscopics 1H and 13C NMR, thermal analysis and mass spectrometry) for a thorough investigation of their structure and chemical–physical properties. The most important results concerning the chemical behavior under different experimental conditions, with particular attention to relevant properties for CVD applications, are presented and discussed. Copyright © 2005 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|