Surface analysis and depth profile composition of bacterial cells by x-ray photoelectron spectroscopy and oxygen plasma etching
| Autor: | Merle M. Millard, Richard S. Thomas, René Scherrer |
|---|---|
| Rok vydání: | 1976 |
| Předmět: |
Biophysics
Analytical chemistry Bacillus subtilis Biochemistry Micrococcus law.invention Cell wall chemistry.chemical_compound Species Specificity X-ray photoelectron spectroscopy law Escherichia coli Molecular Biology Bacillus megaterium Teichoic acid biology Spectrum Analysis X-Rays Cell Membrane fungi Cell Biology biology.organism_classification Microscopy Electron Crystallography Membrane chemistry Elemental analysis bacteria Electron microscope |
| Zdroj: | Biochemical and Biophysical Research Communications. 72:1209-1217 |
| ISSN: | 0006-291X |
| DOI: | 10.1016/s0006-291x(76)80259-8 |
| Popis: | Summary X-ray photoelectron spectroscopy (XPS) was used to analyze the outermost (2–5 nm) surface of bacterial cells. Elemental analysis of the cell surfaces in Bacillus subtilis 168 and Bacillus megaterium KM gave a strong P signal attributed to teichoic acids. Teichoic acid-less Microccus lysodeikticus ha a very weak P signal. Oxygen plasma etching (OPE) combined with XPS and electron microscopy was used to obtain depth profiles of the cell surfaces. Distribution of P (teichoic acid) throughout the cell wall of the two Bacillus species was demonstrated. Separated of the two membranes in Escherichia coli B by their P signal was however not achieved. Na, the common surface cation, was replaced by K upon surface etching. Atomic ratios (C:O:N) of the surface biopolymers essentially agreed with known surface composition. |
| Databáze: | OpenAIRE |
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