Moiré deflectometry with pure sinusoidal gratings

Autor:	Ilana Glatt, Aminadav Livnat, Eliezer Keren
Rok vydání:	2009
Předmět:	Shearing (physics) Diffraction Interferometry Optics Materials science business.industry Moire deflectometry Focal length Moiré pattern Grating business Diffraction grating Atomic and Molecular Physics and Optics
Zdroj:	Optics letters. 10(4)
ISSN:	0146-9592
Popis:	The effect of using a sinusoidal grating instead of a Ronchi ruling as the object grating in moire deflectometry is discussed and demonstrated. The method reduces the diffraction blur, which hinders the use of the conventional moire deflectometer for objects of locally varying focal lengths. The technique combines most of the advantages of moire deflectometry and shearing interferometry.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9fe9c0f71821b3b48081fa3c737037c0 https://pubmed.ncbi.nlm.nih.gov/19724382 Zobrazit plný text záznamu