Estimation of optical parameters of silicon single crystals with different orientations
Autor: | H. A. M. Ali, M.M. El-Nahass |
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Rok vydání: | 2019 |
Předmět: |
010302 applied physics
Materials science Silicon business.industry Mechanical Engineering Physics::Optics chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics single crystals 01 natural sciences Nanomaterials different orientations chemistry Mechanics of Materials optical parameters 0103 physical sciences lcsh:TA401-492 Optoelectronics lcsh:Materials of engineering and construction. Mechanics of materials General Materials Science 0210 nano-technology business |
Zdroj: | Materials Science-Poland, Vol 37, Iss 1, Pp 65-70 (2019) |
ISSN: | 2083-134X |
DOI: | 10.2478/msp-2019-0003 |
Popis: | Optical properties of Si single crystals with different orientations (1 0 0) and (1 1 1) were investigated using spectrophotometric measurements in a spectral range of 200 nm to 2500 nm. The data of optical absorption revealed an indirect allowed transition with energy gap of 1.1 ± 0.025 eV. An anomalous dispersion in refractive index. The normal dispersion of the refractive index was discussed according to Wemple-DiDomenico single oscillator model. The oscillator energy Eo, dispersion energy Ed, high frequency dielectric constant ∈∞, lattice dielectric constant ∈L and electronic polarizability α e were estimated. The real ∈1 and imaginary ∈2 parts of dielectric constant were also determined. |
Databáze: | OpenAIRE |
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