Electrical parasitics and thermal modeling for optimized layout design of high power SiC modules
Autor: | Amir Sajjad Bahman, Atanu Dutta, Frede Blaabjerg, Alan Mantooth |
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Rok vydání: | 2016 |
Předmět: |
Electrical parasitic modeling
Optimization 010302 applied physics Computer science 020208 electrical & electronic engineering SiC power module 02 engineering and technology Reliability 01 natural sciences Finite element method Power (physics) Inductance Reliability (semiconductor) Thermal modeling Power module 0103 physical sciences Parasitic element Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Electronic engineering Parasitic extraction Electrical conductor |
Zdroj: | Bahman, A S, Blaabjerg, F, Dutta, A & Mantooth, A 2016, Electrical Parasitics and Thermal Modeling for Optimized Layout Design of High Power SiC Modules . in Proceedings of the 31st Annual IEEE Applied Power Electronics Conference and Exposition (APEC) . IEEE, pp. 3012-3019, 2016 IEEE Applied Power Electronics Conference and Exposition (APEC), Long Beach, United States, 20/03/2016 . https://doi.org/10.1109/APEC.2016.7468292 |
DOI: | 10.1109/apec.2016.7468292 |
Popis: | The reliability of power modules is closely depended on their electrical and thermal behavior in operation. As power modules are built to operate more integrated and faster, the electrical parasitic and thermal stress issues become more critical. This paper investigates simplified thermal and parasitic inductance models of SiC power modules. These models can replace the models by Finite Element Methods (FEM) to predict temperatures and electrical parasitics of power modules with much faster speed and acceptable errors and will be used for study of real operation of power modules. As a case study, the presented models are verified by a conventional and an optimized power module layout. The optimized layout is designed based on the reduction of stray inductance and temperature in a P-cell and N-cell half-bridge module. The presented models are verified by FEM simulations and also experiment. |
Databáze: | OpenAIRE |
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